Manual and Semiautomatic
Probe Stations for Failure Analysis

Signatone has been supplying semiconductor failure analysis probing equipment since the earliest days of the industry. Each of the probing systems shown below can be configured specially for failure analysis.

Several accessories that are commonly used in device failure analysis are can be seen by clicking on one of the links to the left.

CheckMate Series Probe Stations

CheckMate probe stations are available in five 200mm/300mm versions, and are available with the Signatone Local Chamber option which provides protection from Light and RF during low current analysis, and Condensation during cold probing applications.

CM460 Semi-Automatic Probe Stations

The CM-460 is a 6" Semiautomatic Probe Stations that is rich in features and capability and that offers a human engineered interface to make operation easy and intuitive. CM-460 Systems can be configured for a variety of applications including microwave probing, low current (femtoamp) probing, thermal probing, design/debug, failure analysis, product engineering and many other probing applications.

S-1160 Probe Stations

The S-1160 is a rugged, economically priced probe station that can be fitted with either high powered optics for probing small geometries or lower powered optics for probing bonding pads and larger geometries. The S-1160 is available in a variety of configurations for applications including RF probing, low current (femtoamp range) probing, failure analysis, thermal probing and other uses.

TH76 Test Head Probe Station

The TH76 Test Head Prober is constructed around a vibration isolation table. The test head is "docked" beneath a large plate (the vibration table top) that floats on a cushion of compressed N2 or C.D.A. A hole is milled into the plate to provide for probing into the device...