• Liquid crystal testing
• Dual sided test of hybrids
• Hearing aids
• Multi-chip hybrids and modules
• Medical implant hybrids
• Optical packages

• CMOS imaging devices
• Flex circuits
• Small PCBs
• Products for aerospace
• RF modules
• Custom switch boxes for curve trace

Socket and fixture for testing a ceramic hybrid module and flex circuit for a space satellite. Test points on the ceramic are randomly placed on a pitch as small as 0.5mm.

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This system allows the HiLevel test system to be used for testing under a probe station, in a black box, EMI, and other remote locations from the HiLevel. All 512 channels are available from the Hilevel test system. The interface between the Hilevel test system and the daughter card fixture is through controlled impedance ribbon cable and pogo pin connectors.

The daughter card fixture is designed to set on a wafer chuck for probing or upside down on an EMI system. Daughter cards (DUT boards) are 6.5 x 8.0 inches. The daughter cards interface directly to the pogo pin cables. Loop-back boards are available for system set up and test. The HiLevel interface DUT board plugs directly into the Hilevel. Handles on the DUT board make removal easy.

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This pneumatic assisted fixture was designed for production test of a long narrow PCB used in musical amplifiers.

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This production test fixture included a switch matrix and a custom test socket for a 32 BGA device.

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RTI designed and manufactured 50 of these test systems for a hand-held communications device. Contact to the unit under test was made through pogo pins which went through small holes in the plastic base. The test box contained active electronics to interface to the customers test equipment.

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This customer required that a test socket be mounted to an existing PCB with no existing mounting holes. RTI designed a surface mount socket for the MCM and a clamp to hold the socket on the PCB while still allowing access to all the required connectors on the PCB.

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This ten-up fixture was designed to test medical hybrids. Test pads were located on both the top and bottom of the ceramic hybrid. Multicolor LEDs indicate which hybrid was being tested and the status of each unit ( good, bad, under test, not tested).

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Test socket for a silicon-on-flex circuit with probes on 0.5mm centers. Socket was also designed with a through-hole adaptor with active electronics and mating socket receptacle.

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10-up test socket and test system for high speed optical interface modules. The test system tested 10 units in parallel. The test box was microprocessor controlled and tested for opens and shorts between all pins.

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This fixture is designed for back side test of a 117 BGA package. RTI can supply fixtures for back side test of most package types.

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This fixture was design to perform liquid crystal analysis at the wafer level using a probe station and a hot chuck. The fixture includes a pogo ring interface to the probe cards, custom probe cards, and interface to 34 pin headers as will as all the mechanical interfaces.

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