Tripak Low Current Analysis

LOW CURRENT ANALYSIS

for Measuring fA Currents @ Temperature

Triaxial Chuck

The Signatone Triaxial Package

 

The Signatone Tripak System, combined with a suitable parametric instrument such as the HP4156A, allows measurements of current to the femtoamp (1 x 10 -15A) range at temperatures between ambient and 300°C for tests which may predict reliability and future performance such as:

 

  • MOS device sub threshold off currents (click on graph at the right)
  • Oxide voltage and charge-to-break-down testing
  • Hot carrier degradation and impact ionization current

 

The components of the Triaxial Package are 1) a triaxially driven room temperature chuck or hot chuck, 2) triaxially driven probe tip holders engineered to operate with a 300°C chuck temperature, 3) a suitable electronically shielded dark box, and 4) appropriate cabling.

 

Triaxial Technology

 

Triaxial measurements use a 3 conductor system with a driven guard between the source-sense (conductor to be measured) and the signal ground to enable measurements of very low currents. The results are: 1) A low noise floor which is a measure of the effective noise protection of the probe holder or chuck, shielded box, and the HP4156A or equivlaent meter, 2) A high equivalent resistance devinde by 1/Re=dI/dV where Re is the equivalent resistance and dI/dV is the change of current with voltage, and 3) A low residual capacitance defined by I=CrdV/dT. Where I is the forcing current, Cr is the residual capacitance and dV/dT is the change of voltage over time.

 

 

The Triaxial Chuck is available in standard and temperature chuck configurations. Chucks are easily retrofited to Signatone 6 and 8 inch Probe Stations.

 

Topside Measurements

 

The Signatone triaxial package exhibits a typical noise floor of 2 fA and an effective resistance greater than 1 x 10^15 ohms when probing on top of the wafer at chuck temperatures to 300°C on a Semi-Automatic prober. The low nosie floor is obtained by use of proprietary materials in both the probe holder and the hot chuck plus the use of triaxial technology. The sub-threshold measurements of Ids vs. Vg are typical of the measurements that can be made. (click on graph at top of page).

 

Substrate Current Measurements

 

Most parameters may be measured through a top-side contact. If the actual curent flowing through the chuck to ground must be measured, the porperties of the chuck become important. The Triaxial hot chuck system has a typical effective noise floor of less than 100fA and an effective resistance of approximately 1x10^15 ohms @ 200°C. Although this noise floor will affect the measurement of currents that pass through the chuck, the chuck presents a very quiet environment to devices measured through the topside contacts for measurements of 1 or 2 fA.



Typical Noise Floor - Topside measurements. Note: Actual minimum current resolution is 1 fA (click on graph for larger image)


Typical Noise Floor - 8" Triax Chuck @ 200°C. Note: Actual minimum current resolution is 1fA (click on graph for larger image)


Typical Triaxial Probing System
shown with prober in a dark box. Click image to see a larger photo



Triaxial Probing System
Prober equipped with local dry chamber- Click image to see a larger photo

Specifications
Electrical Characteristics* Noise Floor Effective Resistance ohms @ Chuck Temp.
Probe tip holder & tip
+/- 2fA
>1 x 10^15
300°C
6" Chuck
<30 fA
>1 x 10^15
Ambient
8" Chuck
<30 fA
>5 x 10^15
Ambient
6" Chuck
<50 fA
>5 x 10^15
200°C
8" Chuck
<50 fA
>5 x 10^15
200°C

 

Note: Measurements made on an HP4156A under Long integration with a 10 second hold time and a 1 second delay time after temperature stabilization and zeroing the SMU

 

Residual Capacitance*

6" & 8" both @ Ambient & 200°C.....................4 pf typical


Note: Measured on an HP4156A by recording the voltage change versus time while forcing current with the guard enabled.

Temperature Parameters 6" chuck 8" Chuck
Ambient to 200°C typical
10 min.
16 min.
200°C to Ambient
4 min.
4 min.
Uniformity at 200°C
+/-2°C
+/-3°C
Max Operating Temp.
300°C
300°C


Physical Parameters Diameter Thickness or Length Cable Length
Probe tip holder
0.187"
2.5"
60"
Room Temp. Chuck
6.5"/8.5"
0.625"
60"
High Temp. Chuck
6.5"/8.5"
1.25"
60"

 

Signatone Triaxial Hot Chuck Performance

Wafer

Temperature

Chuck

Leakage

Chuck

Noise

Chuck

Resistance

Probe

Leakage

Probe

Noise

Probe

Resistance

25OC

 

 

 

<+/- 20 fA

+/- 2 fA

>1x1015 W

50OC

<+/-100 fA

+/- 30 fA

>5x1014 W

<+/- 20 fA

+/- 2 fA

>1x1015 W

100 OC

<+/-100 fA

+/- 30 fA

>5x1014 W

<+/- 20 fA

+/- 2 fA

>1x1015 W

200 OC

<+/- 1 pA

+/- 100 fA

>5x1014 W

<+/- 20 fA

+/- 2 fA

>1x1015 W

250 OC

<+/- 3 pA

+/- 100 fA

>1x1014 W

<+/- 20 fA

+/- 2 fA

>1x1015 W

300 OC

~30 pA

+/- 1.5 pA

~5x1013 W

<+/- 20 fA

+/- 2 fA

>1x1015 W

350 OC

~325 pA

+/- 4 pA

~1x1013 W

<+/- 20 fA

+/- 3 fA

~5x1014 W

400 OC

~3 nA

+/- 30 pA

~2x1011 W

<+/- 20 fA

+/- 3 fA

~2x1014 W

 

Applications Notes for low current analysis.